Szerző: " Hoffmann Veit"

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Friede Sebastian; Tomm Jens W.; Kühn Sergei; Hoffmann Veit; Wenzel Hans: Analysis of waveguide architectures of InGaN/GaN diode lasers by nearfield optical microscopy.
In: Novel In-Plane Semiconductor Lasers XVI. Proceedings of SPIE (10123). International Society for Optics and Photonics, Bellingham (WA). (2017) ISBN 9781510606876; 9781510606883

Friede Sebastian; Tomm Jens W.; Kühn Sergei; Hoffmann Veit; Wenzel Hans; Weyers Markus: Near-field microscopy of waveguide architectures of InGaN/GaN diode lasers.
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 31 (11). ISSN 0268-1242 (2016)

A lista elkészítésének dátuma 2024. november 22. 11:37:40 CET.