Friede Sebastian; Tomm Jens W.; Kühn Sergei; Hoffmann Veit; Wenzel Hans:
Analysis of waveguide architectures of InGaN/GaN diode lasers by nearfield optical microscopy.
In:
Novel In-Plane Semiconductor Lasers XVI.
Proceedings of SPIE
(10123).
International Society for Optics and Photonics, Bellingham (WA).
(2017)
ISBN 9781510606876; 9781510606883
Friede Sebastian; Tomm Jens W.; Kühn Sergei; Hoffmann Veit; Wenzel Hans; Weyers Markus:
Near-field microscopy of waveguide architectures of InGaN/GaN diode lasers.
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 31 (11).
ISSN 0268-1242
(2016)