Friede Sebastian and Tomm Jens W. and Kühn Sergei and Hoffmann Veit and Wenzel Hans:
Analysis of waveguide architectures of InGaN/GaN diode lasers by nearfield optical microscopy.
In:
Novel In-Plane Semiconductor Lasers XVI.
Proceedings of SPIE
(10123).
International Society for Optics and Photonics, Bellingham (WA).
(2017)
ISBN 9781510606876; 9781510606883
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| Item Type: | Book Section | |||||
| Date: | 2017 | |||||
| Number: | 10123 | |||||
| Number of Pages: | 7 | |||||
| Publication identifier: | 1012308 | |||||
| ISBN: | 9781510606876; 9781510606883 | |||||
| Publisher: | International Society for Optics and Photonics | |||||
| Place of Publication: | Bellingham (WA) | |||||
| Faculty/Unit: | ELI-HU | |||||
| Institution: | University of Szeged (2000-) | |||||
| Language: | English | |||||
| MTMT rekordazonosító: | 33298452 | |||||
| DOI azonosító: | https://doi.org/10.1117/12.2249563 | |||||
| Date Deposited: | 2024. Jul. 04. 08:35 | |||||
| Last Modified: | 2024. Jul. 04. 08:35 | |||||
| URI: | http://publicatio.bibl.u-szeged.hu/id/eprint/33981 |
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