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Clustering empirical failure rate curves for reliability prediction purposes in case of consumer electronic products

Dombi József and Jónás Tamás and Tóth Zsuzsanna Eszter: Clustering empirical failure rate curves for reliability prediction purposes in case of consumer electronic products.
QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL, 32 (3). pp. 1071-1083. ISSN 0748-8017 (2016)

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Creators:
Dombi József MTMT
Jónás Tamás MTMT
Tóth Zsuzsanna Eszter MTMT
Item Type: Journal Article
Journal or Publication Title: QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL
Date: 2016
Volume: 32
Number: 3
Page Range: pp. 1071-1083
ISSN: 0748-8017
Faculty/Unit: Faculty of Science and Informatics
Institution: University of Szeged (2000-)
Language: English
MTMT rekordazonosító: 2880381
DOI azonosító: https://doi.org/10.1002/qre.1815
Date Deposited: 2019. Dec. 17. 12:24
Last Modified: 2019. Dec. 17. 12:24
URI: http://publicatio.bibl.u-szeged.hu/id/eprint/17651
Web of Science® Times Cited: 8 View citing articles in Web of Science®

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