TY  - CHAP
SP  - Terjedelem: 10 p.
ID  - publicatio12098
ED  -  Cormier E 
ED  -  Sarger L 
AV  - public
N2  - A laboratory exercise has been developed in the frames of a 
new course called "Advanced undergraduate laboratory in 
femtosecond optics", which aims to study the dependence of 
the dispersion of a prism pair on the positions of the 
prisms. For the dispersion measurement we chose a relatively 
simple technique, called white light spectral interferometry. 
The prism pair consisting of two identical fused silica 
prisms was placed in the sample arm of a Michelson-
interferometer illuminated with a tungsten halogen lamp. The 
interferograms were observed with a low resolution 
spectrometer in order to have a wide detection range (200-
1100 nm). Measurements were performed by adjusting the 
optical path length in the second prism. The data was 
evaluated with the cosine-function fit method. Using the 
formalism of Fork the phase derivatives were theoretically 
calculated as well. The dependence of the dispersion 
coefficients on the displacement of the second prism agree 
well with the measurements. Using white light is advantageous 
as its broad wavelength range facilitates the retrieval of 
the spectral phase with high precision in a wide range. 
Furthermore, white light sources are relatively low-cost and 
safe in contrast to ultrashort laser sources. Š COPYRIGHT 
SPIE.
A1  -  Tímár-Grósz Tímea
A1  -  Gulyás Lénárd
A1  -  Kovács Attila Pál
CY  - Bordeaux
PB  - International Society for Optical Engineering (SPIE)
N1  - FELTÖLT?: Grósz Tímea - tgrosz@titan.physx.u-szeged.hu
A4 EPIC; et al.; Micro-Controle Spectra-Physics SAS; Ocean 
Optics, Inc.; PI Micos GmbH; Route des Lasers
#Könyv  Kiadás helye nem található: Bordeaux
TI  - Advanced laboratory exercise: studying the dispersion properties of a prism pair
T3  - Proceedings of SPIE - The International Society for Optical Engineering
UR  - http://publicatio.bibl.u-szeged.hu/12098/
Y1  - 2015///
EP  - Azonosító: 97931N
T2  - Education and Training in Optics and Photonics, ETOP 2015
SN  - 0277-786X
ER  -