Current and voltage based bit errors and their combined mitigation for the Kirchhoff-law–Johnson-noise secure key exchange

Saez, Yessica, Kish, László B., Mingesz, Róbert Zoltán, Gingl, Zoltán, Granqvist, Claes G.: Current and voltage based bit errors and their combined mitigation for the Kirchhoff-law–Johnson-noise secure key exchange.
Journal of Computational Electronics, 13 (1). pp. 271-277. ISSN 1569-8025 (2014)

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Item Type: Article
Journal or Publication Title: Journal of Computational Electronics
Date: 2014
Volume: 13
Number: 1
Page Range: pp. 271-277
ISSN: 1569-8025
Faculty: Faculty of Science and Informatics
Department: Műszaki Informatika Tanszék
Institution: Szegedi Tudományegyetem
MTMT id: 2448134
DOI id: https://doi.org/10.1007/s10825-013-0515-2
Date Deposited: 2014. Jun. 23. 15:40
Last Modified: 2018. Aug. 29. 08:59
URI: http://publicatio.bibl.u-szeged.hu/id/eprint/4288
Web of Science® Times Cited: 8 View citing articles in Web of Science®

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