Égerházi László and Geretovszky Zsolt and Csákó Tamás and Szörényi Tamás:
Atomic force microscopic characterization of films grown by inverse pulsed laser deposition.
APPLIED SURFACE SCIENCE, 252.
pp. 4661-4666.
ISSN 0169-4332
(2006)
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Item Type: | Journal Article | ||||
Journal or Publication Title: | APPLIED SURFACE SCIENCE | ||||
Date: | 2006 | ||||
Volume: | 252 | ||||
Page Range: | pp. 4661-4666 | ||||
ISSN: | 0169-4332 | ||||
Faculty/Unit: | Faculty of Science and Informatics | ||||
Institution: | University of Szeged (2000-) | ||||
Language: | English | ||||
MTMT rekordazonosító: | 155801 | ||||
DOI azonosító: | https://doi.org/10.1016/j.apsusc.2005.07.083 | ||||
Date Deposited: | 2020. Feb. 04. 08:45 | ||||
Last Modified: | 2020. Feb. 04. 08:45 | ||||
URI: | http://publicatio.bibl.u-szeged.hu/id/eprint/18152 |
Web of Science® Times Cited: 8 | View citing articles in Web of Science® |
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