Atomic force microscopic characterization of films grown by inverse pulsed laser deposition

Égerházi, László, Geretovszky, Zsolt, Csákó, Tamás, Szörényi, Tamás: Atomic force microscopic characterization of films grown by inverse pulsed laser deposition.
APPLIED SURFACE SCIENCE, 252. pp. 4661-4666. ISSN 0169-4332 (2006)

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Item Type: Article
Journal or Publication Title: APPLIED SURFACE SCIENCE
Date: 2006
Volume: 252
Page Range: pp. 4661-4666
ISSN: 0169-4332
Faculty: Faculty of Science and Informatics
Institution: Szegedi Tudományegyetem
MTMT id: 155801
DOI id: https://doi.org/10.1016/j.apsusc.2005.07.083
Date Deposited: 2020. Feb. 04. 08:45
Last Modified: 2020. Feb. 04. 08:45
URI: http://publicatio.bibl.u-szeged.hu/id/eprint/18152
Web of Science® Times Cited: 8 View citing articles in Web of Science®

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