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Atomic force microscopic characterization of films grown by inverse pulsed laser deposition

Égerházi László and Geretovszky Zsolt and Csákó Tamás and Szörényi Tamás: Atomic force microscopic characterization of films grown by inverse pulsed laser deposition.
APPLIED SURFACE SCIENCE, 252. pp. 4661-4666. ISSN 0169-4332 (2006)

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Creators:
Égerházi László MTMT
Geretovszky Zsolt MTMT
Csákó Tamás MTMT
Szörényi Tamás MTMT
Item Type: Journal Article
Journal or Publication Title: APPLIED SURFACE SCIENCE
Date: 2006
Volume: 252
Page Range: pp. 4661-4666
ISSN: 0169-4332
Faculty/Unit: Faculty of Science and Informatics
Institution: University of Szeged (2000-)
Language: English
MTMT rekordazonosító: 155801
DOI azonosító: https://doi.org/10.1016/j.apsusc.2005.07.083
Date Deposited: 2020. Feb. 04. 08:45
Last Modified: 2020. Feb. 04. 08:45
URI: http://publicatio.bibl.u-szeged.hu/id/eprint/18152
Web of Science® Times Cited: 8 View citing articles in Web of Science®

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