Égerházi, László, Geretovszky, Zsolt, Csákó, Tamás, Szörényi, Tamás:
Atomic force microscopic characterization of films grown by inverse pulsed laser deposition.
APPLIED SURFACE SCIENCE, 252.
pp. 4661-4666.
ISSN 0169-4332
(2006)
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| Item Type: | Article |
|---|---|
| Journal or Publication Title: | APPLIED SURFACE SCIENCE |
| Date: | 2006 |
| Volume: | 252 |
| Page Range: | pp. 4661-4666 |
| ISSN: | 0169-4332 |
| Faculty: | Faculty of Science and Informatics |
| Institution: | Szegedi Tudományegyetem |
| MTMT id: | 155801 |
| DOI id: | https://doi.org/10.1016/j.apsusc.2005.07.083 |
| Date Deposited: | 2020. Feb. 04. 08:45 |
| Last Modified: | 2020. Feb. 04. 08:45 |
| URI: | http://publicatio.bibl.u-szeged.hu/id/eprint/18152 |
| Web of Science® Times Cited: 8 | View citing articles in Web of Science® |
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