Égerházi László and Geretovszky Zsolt and Csákó Tamás and Szörényi Tamás:
Atomic force microscopic characterization of films grown by inverse pulsed laser deposition.
APPLIED SURFACE SCIENCE, 252.
pp. 4661-4666.
ISSN 0169-4332
(2006)
![[thumbnail of Atomicforcemicroscopiccharacterizationoffilmsgrownbyinversepulsedlaserdeposition.pdf]](http://publicatio.bibl.u-szeged.hu/style/images/fileicons/text.png) |
Text
Atomicforcemicroscopiccharacterizationoffilmsgrownbyinversepulsedlaserdeposition.pdf - Published Version Restricted access: Registered users only Download (531kB) |
| Item Type: | Journal Article |
|---|---|
| Journal or Publication Title: | APPLIED SURFACE SCIENCE |
| Date: | 2006 |
| Volume: | 252 |
| Page Range: | pp. 4661-4666 |
| ISSN: | 0169-4332 |
| Faculty/Unit: | Faculty of Science and Informatics |
| Institution: | Szegedi Tudományegyetem |
| Language: | English |
| MTMT rekordazonosító: | 155801 |
| DOI azonosító: | https://doi.org/10.1016/j.apsusc.2005.07.083 |
| Date Deposited: | 2020. Feb. 04. 08:45 |
| Last Modified: | 2020. Feb. 04. 08:45 |
| URI: | http://publicatio.bibl.u-szeged.hu/id/eprint/18152 |
| Web of Science® Times Cited: 8 | View citing articles in Web of Science® |
Actions (login required)
 |
View Item |
Download Statistics
Download Statistics
