Reduction of deoxynivalenol (DON) contamination by improved fungicide use in wheat. Part 1. Dependence on epidemic severity and resistance level in small plot tests with artificial inoculation

Mesterházy, Ákos, Varga, Mónika, Tóth, Beáta, Kótai, C., Bartók, Tibor, Véha, Antal, Ács, Katalin, Vágvölgyi, Csaba, Lehoczki-Krsjak, Szabolcs: Reduction of deoxynivalenol (DON) contamination by improved fungicide use in wheat. Part 1. Dependence on epidemic severity and resistance level in small plot tests with artificial inoculation.
EUROPEAN JOURNAL OF PLANT PATHOLOGY, 151 (1). pp. 39-55. ISSN 0929-1873 (2018)

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Item Type: Article
Journal or Publication Title: EUROPEAN JOURNAL OF PLANT PATHOLOGY
Date: 2018
Volume: 151
Number: 1
Page Range: pp. 39-55
ISSN: 0929-1873
Publisher: Springer Netherlands
Faculty: Faculty of Engineering
Faculty of Science and Informatics
Institution: Szegedi Tudományegyetem
MTMT id: 3329091
DOI id: https://doi.org/10.1007/s10658-017-1350-2
Date Deposited: 2018. Jun. 14. 11:32
Last Modified: 2018. Jun. 14. 12:16
URI: http://publicatio.bibl.u-szeged.hu/id/eprint/13483
Web of Science® Times Cited: 5 View citing articles in Web of Science®

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