Ultrafast in-situ null-ellipsometry for studying pulsed laser – Silicon surface interactions

Csontos, János, Tóth, Zsolt, Pápa, Zsuzsanna, Gábor, B., Füle, Miklós Jenő, Gilicze, Barnabás, Budai, Judit: Ultrafast in-situ null-ellipsometry for studying pulsed laser – Silicon surface interactions.
APPLIED SURFACE SCIENCE, 421 (Part B). pp. 325-330. ISSN 0169-4332 (2017)

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Item Type: Article
Journal or Publication Title: APPLIED SURFACE SCIENCE
Date: 2017
Volume: 421
Number: Part B
Page Range: pp. 325-330
ISSN: 0169-4332
Publisher: Elsevier
Faculty: Faculty of Dentistry
Faculty of Science and Informatics
Institution: Szegedi Tudományegyetem
MTMT id: 3275473
DOI id: https://doi.org/10.1016/j.apsusc.2017.03.186
Date Deposited: 2017. Oct. 18. 11:37
Last Modified: 2020. Feb. 10. 11:54
URI: http://publicatio.bibl.u-szeged.hu/id/eprint/12116
Web of Science® Times Cited: 3 View citing articles in Web of Science®

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