Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density

Tengeri, Dávid, Vidács, László, Beszédes, Árpád, Jász, Judit, Balogh, Gergő, Vancsics, Béla, Gyimóthy, Tibor: Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density.
In: 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW). IEEE Computer Society, USA, pp. 174-179. (2016) ISBN 978-1-5090-1826-0

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Item Type: Book Section
Date: 2016
Page Range: pp. 174-179
ISBN: 978-1-5090-1826-0
Publisher: IEEE Computer Society
Place of Publication: USA
Faculty: Faculty of Science and Informatics
Institution: Szegedi Tudományegyetem
MTMT id: 3109514
Date Deposited: 2017. Jan. 26. 16:09
Last Modified: 2019. Jun. 05. 10:04
URI: http://publicatio.bibl.u-szeged.hu/id/eprint/10372

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