Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density

Tengeri Dávid and Vidács László and Beszédes Árpád and Jász Judit and Balogh Gergő and Vancsics Béla and Gyimóthy Tibor: Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density.
In: 2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW). IEEE Computer Society, USA, pp. 174-179. (2016) ISBN 978-1-5090-1826-0

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Item Type: Book Section
Date: 2016
Page Range: pp. 174-179
ISBN: 978-1-5090-1826-0
Publisher: IEEE Computer Society
Place of Publication: USA
Faculty/Unit: Faculty of Science and Informatics
Institution: Szegedi Tudományegyetem
Language: English
MTMT rekordazonosító: 3109514
Date Deposited: 2017. Jan. 26. 16:09
Last Modified: 2019. Jun. 05. 10:04
URI: http://publicatio.bibl.u-szeged.hu/id/eprint/10372

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