Tengeri, Dávid, Vidács, László, Beszédes, Árpád, Jász, Judit, Balogh, Gergő, Vancsics, Béla, Gyimóthy, Tibor:
Relating Code Coverage, Mutation Score and Test Suite Reducibility to Defect Density.
In:
2016 IEEE Ninth International Conference on Software Testing, Verification and Validation Workshops (ICSTW).
IEEE Computer Society, USA, pp. 174-179.
(2016)
ISBN 978-1-5090-1826-0
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mutation2016-defectdensity.pdf - Submitted Version Download (408kB) | Preview |
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| Item Type: | Book Section |
|---|---|
| Date: | 2016 |
| Page Range: | pp. 174-179 |
| ISBN: | 978-1-5090-1826-0 |
| Publisher: | IEEE Computer Society |
| Place of Publication: | USA |
| Faculty: | Faculty of Science and Informatics |
| Institution: | Szegedi Tudományegyetem |
| MTMT id: | 3109514 |
| Date Deposited: | 2017. Jan. 26. 16:09 |
| Last Modified: | 2019. Jun. 05. 10:04 |
| URI: | http://publicatio.bibl.u-szeged.hu/id/eprint/10372 |
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